Page 128 - 《应用声学》2022年第1期

第 41 卷 第 1 期 Vol. 41, No. 1
2022 年 1 月 Journal of Applied Acoustics January, 2022

⋄ 研究报告 ⋄

应用超声干涉特征识别微小缺陷

沙正骁 1,3,4 曾甘露 2† 梁 菁 1,3,4 陆铭慧 2 何方成 1,3,4 陆传雨 2

(1 中国航发北京航空材料研究院 北京 100095)
(2 南昌航空大学 南昌 330063)

(3 航空材料检测与评价北京市重点实验室 北京 100095)
(4 中国航空发动机集团材料检测与评价重点实验室 北京 100095)
摘要：航空用金属材料中允许存在的缺陷越来越小，有时需要识别几十微米的夹渣缺陷。由于微小缺陷对声
波的反射能力弱，常用的超声脉冲反射法的识别能力遇到瓶颈。该文利用超声干涉原理对微小缺陷进行识别。
首先，理论分析入射波与微缺陷散射波的干涉机理；其次，采用有限元仿真方法分析了入射波经过微小缺陷后
的波形变化，归纳出入射波与微缺陷散射波干涉规律。最后，以底波尾部干涉波列幅值作为成像参量对微小缺
陷试样进行了成像检测，得到微小缺陷灰度图像。研究结果表明：该方法能够有效识别埋深 5 ∼ 80 mm、孔径
为 ϕ0.1 mm 的微小缺陷，当缺陷埋深小于 5 mm 时，能够有效区分横向间距 1 mm、ϕ0.2 mm 的相邻微缺陷。
关键词：微小缺陷；散射波；超声干涉；有限元仿真
中图法分类号: TG115.28 文献标识码: A 文章编号: 1000-310X(2022)01-0124-08
DOI: 10.11684/j.issn.1000-310X.2022.01.015

Application of ultrasonic interference features to identify micro defects

SHA Zhengxiao 1,3,4 ZENG Ganlu 2 LIANG Jing 1,3,4 LU Minghui 2

HE Fangcheng 1,3,4 LU Chuanyu 2

(1 AECC Beijing Institute of Aeronautical Materials, Beijing 100095, China)
(2 Nanchang Hangkong University, Nanchang 330063, China)
(3 Beijing Key Laboratory of Aeronautical Materials Testing and Evaluation, Beijing 100095, China)
(4 Key Laboratory of Science and Technology on Aeronautical Materials Testing and Evaluation,
Aero Engine Corporation of China, Beijing 100095, China)
Abstract: The allowable defects in aviation metal materials are getting smaller and smaller, sometimes it is
necessary to identify the slag inclusion defects of tens of microns. Due to the weak reflection ability of micro
defects to sound waves, the recognition ability of the commonly used ultrasonic pulse reflection method meets
the bottleneck. In this paper, the principle of ultrasonic interference is used to identify micro defects. Firstly,
the interference mechanism between incident wave and scattering wave is analyzed theoretically. Secondly,
the waveform variation of the incident wave after passing through micro defect is analyzed by finite element
simulation method, and the interference pattern between the incident and scattering waves is summarized.
Finally, the amplitude of the interference pattern at the end of the wave is used as the imaging parameter
to identify the micro defect, and the gray image of the micro defect is obtained. The results show that:

2021-03-01 收稿; 2021-06-21 定稿
作者简介: 沙正骁 (1985– ), 男, 山东济南人, 硕士, 工程师, 研究方向: 航空材料超声无损检测。
† 通信作者 E-mail: 1345746568@qq.com